Jóni, Bertalan, Gonda, Viktor, Verő, Balázs and Ungár, Tamás (2014) X-ray line profile analysis of equal channel angular pressing processed Cu. IOP CONFERENCE SERIES: MATERIALS SCIENCE AND ENGINEERING, 63 (1). pp. 1-6. ISSN 1757-8981; 1757-899X
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Abstract
The effect of equal channel angular pressing on the microstructure of copper samples was studied by X-ray line profile analysis. Pure Cu samples were processed by equal channel angular pressing with 3 passes in route A. Samples were taken from the vicinity of the channel intersection, and along a profile across the deformation zone, microhardness and XRD measurements were performed. For the high resolution line profile analysis of the diffraction spectra, convolutional-multiple-whole-profile CMWP method was applied, dislocation density and grain size were calculated, furthermore the density of twin boundaries were determined. Results show a rearrangement in the dislocations in the third pass leading to a rise in the density of twin boundaries.
Item Type: | Article |
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Divisions: | Műszaki Intézet |
Depositing User: | Gergely Beregi |
Date Deposited: | 14 Apr 2021 11:52 |
Last Modified: | 14 Apr 2021 12:07 |
URI: | http://publication.repo.uniduna.hu/id/eprint/743 |
MTMT: | 2807265 |
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